Materials

HORIBA Scientific offers 200 years of experience in developing high-performance scientific instruments and analytical solutions.

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Particle Size Analyzers CS and ONH Analyzers Raman Spectrometers

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Materials and Semiconductor

Partica LA-960V2

Laser Scattering Particle Size Analyzer

High accuracy: NIST-traceable within 0.6%
Rapid wet analysis: < 60 s per sample
Automated dry dispersion: self-adjusting PowderJet
Broad size range: 10 nm–5,000 µm

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Materials and Semiconductor

LabRAM Soleil

Confocal Raman Microscope with advanced automation and imaging features.

Motorized Grating Selection: 4 gratings
AFM & TERS Compatibility: AFM & TERS
Laser light‑sheet: QScan™ 3D Imaging
Parameter check: SmartID™ Assurance

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Materials and Semiconductor

EMIA-Expert

Carbon/Sulfur Analyzer (Flagship High-Accuracy Model)

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Materials and Semiconductor

DeltaFlex

TCSPC Lifetime Fluorometer

Extended Measurement Range: 25 ps – 1 s
Expandable Modular Design: F-Link System
Comprehensive Wavelength Options: UV–NIR Capability
Fast Data Acquisition: Up to 1,000 decays/sec

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Materials and Semiconductor

Duetta

Fluorescence and Absorbance Spectrometer

High‑Speed Acquisition: Full‑spectrum (250–1,100 nm) in <1 second
Superior Sensitivity: 6,000:1 RMS for Water Raman
3‑in‑1 Functionality: Fluorescence + Absorbance + A‑TEEM™
Intuitive Software: EzSpec™ touch‑screen interface

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Materials and Semiconductor

EMGA‑Pro (EMGA‑20P)

Oxygen/Nitrogen Analyzer

Rapid analysis: 70 sec cycle
Reduced maintenance time: Electrode replacement in 1/10 the time
Efficient gas usage: 2,300 measurements per 47 L cylinder
User‑friendly software: Self‑diagnostics & alarm function

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Materials and Semiconductor

EMGA‑Expert 30E

Oxygen/Nitrogen/Hydrogen Analyzer

Overwhelming speed: Cycle time reduced by 40%
Exceptional accuracy: Proven NDIR & in‑house TCD detectors
Extended uptime: Electrode and filter replacement in 1/10 the time
Automation flexibility: Crucible Loader (100 pcs), Auto Sampler (22 samples), Auto Cleaner

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Materials and Semiconductor

FluoroMax Plus

Steady State and Lifetime Spectrofluorometer

Ultimate sensitivity: 13,000:1 Water Raman SNR
Extended spectral range: Emission up to 1700 nm
Rapid scanning: 80 nm/second
Ultrafast lifetime measurements: 25 ps TCSPC

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Materials and Semiconductor

Ultima Expert LT

ICP-OES Spectrometer

Ultimate resolution: <5 pm optical resolution
Outstanding stability: Sheath gas stability up to 30% TDS
Broad wavelength range: 120–800 nm with Far UV option
High sensitivity: Patented HDD detection to sub-ppb levels

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Materials and Semiconductor

nanoPartica SZ-100V2 Series

Nanoparticle Analyzer

Enables simultaneous nanoparticle characterization: multi-parameter analysis
Wide concentration flexibility: 0.001 wt%–40 wt% range
Microvolume sampling: 100 µL
Ensures accurate analysis across sample types: Dual optical system

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