XploRA Nano

AFM-Raman System

The XploRA Nano is a fully integrated, compact AFM-Raman system combining high-resolution atomic force microscopy with confocal Raman and photoluminescence capabilities. It enables users to perform macro-, micro-, and nanoscale imaging (down to 10 nm), including Tip-Enhanced Raman Spectroscopy (TERS) and photoluminescence (TEPL), all within a user-friendly, automated platform.

XploRA Nano

AFM-Raman System

Why Choose XploRA Nano

Multi-Scale Capability – Seamlessly handles macro to nanoscale imaging, including TERS/TEPL.
Automated & Easy – Fully motorized operation — begin measurements in minutes.
High Resolution & Sensitivity – Achieves true confocality with exceptional spectral and spatial precision.
Versatile Multi-Technique Support – Accommodates AFM, conductive modes, STM, liquid cells, and more in one system.

Key Advantages of XploRA Nano

Ultra-Small Spatial Resolution

Down to 10 nm

Delivers nanoscale chemical imaging using tip-enhanced optical spectroscopies like TERS/TEPL.

Fast, Fully Automated Setup

Minutes to Start

Motorized scanning and alignment allow rapid, hassle-free measurements.

Superior Optical Clarity

True Confocal Design

Combines high spatial and spectral resolution for precise Raman/PL analysis.

Multi-Mode Flexibility

AFM + Raman + More

Supports varied analytical techniques—including conductive AFM and STM—in a unified platform.

Technical Specifications of XploRA Nano

SmartSPM Scanner and Base

Sample scanning range: 100 µm x 100 µm x 15 µm (±10 %)

Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %

Noise: 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth

Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)

X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm

Sample size: Maximum 40 x 50 mm, 15 mm thickness

Sample positioning: Motorized sample positioning range 5 x 5 mm

Positioning resolution: 1 µm

AFM Head

Laser wavelength: 1300 nm, non-interfering with spectroscopic detector

Alignment: Fully automated cantilever and photodiode alignment

Probe access: Free access to the probe for additional external manipulators and probes

SPM Measuring Modes

Contact AFM in air/(liquid optional); Semicontact AFM in air/(liquid optional); Non -contact AFM; Phase imaging; Lateral Force Microscopy (LFM); Force Modulation; Conductive AFM (optional); Magnetic Force Microscopy (MFM); Kelvin Probe (Surface Potential Microscopy, SKM, KPFM); Capacitance and Electric Force Microscopy (EFM); Force curve measurement; Piezo Response Force Microscopy (PFM); Nanolithography; Nanomanipulation; STM (optional); Photocurrent Mapping (optional); Volt-ampere characteristic measurements (optional)

Spectroscopy Modes

Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy

Tip-Enhanced Raman Spectroscopy (TERS) in AFM, STM, and shear force modes

Tip-EnhancedPhotoluminescence (TEPL)

Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)

Conductive AFM Unit (optional)

Current range: 100 fA ÷ 10 µA; 3 current ranges (1 nA, 100 nA and 10 µA) switchable from the software

Optical Access

Capability to use simultaneously top and side plan apochromat objective: Up to 100x, NA = 0.7 from top or side; Up to 20x and 100x simultaneously

Closed loop piezo objective scanner for ultra stable long term spectroscopic laser alignment: Range 20 µm x 20 µm x 15 µm; Resolution: 1 nm

Spectrometer

Fully automated XploRA Plus compact micro-spectrometers, functional as stand-alone micro-Raman microscope

Wavelength range: 60 cm-1 to 4000 cm-1

Gratings: 4 gratings on computer controlled turret (600, 1200, 1800 and 2400 g/mm)

Automation: Fully motorized, software controlled operation

Detection

Full range of CCD detectors and EMCCDs.

Laser Sources

Typical wavelength: 532 nm, 638 nm, 785 nm.

Automation: Fully motorized, software controlled operation

Software

Integrated software package including full featured SPM, spectrometer and data acquisition control, spectroscopic and SPM data analysis and processing suite, including spectral fitting, deconvolution and filtering, optional modules include univariate and multivariate analysis suite (PCA, MCR, HCA, DCA), particle detection and spectral search functionalities.