XploRA Nano

SmartSPM Scanner and Base

Sample scanning range: 100 µm x 100 µm x 15 µm (±10 %)

Scanning type by sample: XY non-linearity 0.05 %; Z non-linearity 0.05 %

Noise: 

• < 0.1 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors on
• < 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off
• < 0.1 nm RMS in Z dimension in 1000 Hz bandwidth with capacitance sensor on
• < 0.03 nm RMS in Z dimension in 1000 Hz bandwidth with capacitance sensor off

Resonance frequency: XY: 7 kHz (unloaded); Z: 15 kHz (unloaded)

X, Y, Z movement: Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm

Sample size: Maximum 40 x 50 mm, 15 mm thickness

Sample positioning: Motorized sample positioning range 5 x 5 mm

Positioning resolution: 1 µm

AFM Head

Laser wavelength: 1300 nm, non-interfering with spectroscopic detector

Alignment: Fully automated cantilever and photodiode alignment

Probe access: Free access to the probe for additional external manipulators and probes

SPM Measuring Modes

• Contact AFM
• Semicontact AFM
• True Non-contact AFM
• Top ModeTM
• Phase Imaging
• Dissipation Force Microscopy
• Contact AFM in liquid (optional)
• Semicontact AFM in liquid (optional)

Spectroscopy Modes

• Full optical microscopy capabilities including bright field imaging, dark field imaging, etc
• Confocal Raman, Fluorescence and Photoluminescence imaging and spectroscopy
• Tip-Enhanced Raman Spectroscopy (TERS) in AFM and STM modes
• Tip-EnhancedPhotoluminescence (TEPL)
• Near-field Optical Scanning Microscopy and Spectroscopy (NSOM/SNOM)

Conductive AFM Unit (optional)

Current range:  100 fA ÷ 10 µA; 3 current ranges (1 nA, 100 nA and 10 µA) switchable from the software

Optical Access

• Capability to use simultaneously top and side plan apochromat objective: Up to 100x, NA = 0.7 from top or side; Up to 20x and 100x simultaneously
• Closed loop piezo objective scanner for ultra stable long term spectroscopic laser alignment: Range 30 µm x 30 µm x 15 µm; Resolution: 1 nm

Spectrometer

Fully automated XploRA Plus compact micro-spectrometers, functional as stand-alone micro-Raman microscope

Wavelength range: 60 cm-1 to 4000 cm-1 

Gratings: 4 gratings on computer controlled turret (600, 1200, 1800 and 2400 g/mm)

Automation: Fully motorized, software controlled operation

Detection

Full range of CCD detectors and EMCCDs.

Laser Sources

Typical wavelength: 532 nm, 638 nm, 785 nm.

Automation: Fully motorized, software controlled operation

Software

Integrated software package including full featured SPM, spectrometer and data acquisition control, spectroscopic and SPM data analysis and processing suite, including spectral fitting, deconvolution and filtering, optional modules include univariate and multivariate analysis suite (CLS, PCA, MCR, k-means, PLS, etc), particle detection and spectral search functionalities.