LabRAM Soleil Nano
AFM-Raman Nanoscopy System
LabRAM Soleil Nano is a fully integrated AFM‑Raman nanoscopy system combining HORIBA’s LabRAM Soleil Raman microscope with OmegaScope scanning probe microscopy. It enables co‑localized AFM imaging (topographic, electrical, mechanical) and Raman/photoluminescence spectroscopy, performed sequentially or simultaneously at a single sample location. Tip‑Enhanced Raman Spectroscopy (TERS) and Photoluminescence (TEPL) achieve optical resolution down to 10 nm. Compatible with environmental and low‑temperature chambers, it offers automated operation, high collection efficiency, and ultrafast imaging with SmartSampling™ and Q‑Scan™ modes.
Why Choose LabRAM Soleil Nano
- Real‑time co-localized AFM and Raman/PL measurements at the same sample location
- TERS/TEPL for optical resolution down to 10 nm
- Macro‑to‑nanoscale multimodal analysis on one AFM‑Raman platform
- Fully automated operation enabling results within minutes
- High collection efficiency via top‑down and oblique detection with high‑NA objectives
- Environmental and low‑temperature chamber compatibility for controlled studies
Key Advantages of LabRAM Soleil Nano
1.
Ultrafast mapping
Turns hours of Raman mapping into minutes
2.
Nanoscale optical resolution
Reveals chemical information beyond diffraction limits
3.
Broad multimodal flexibility
Up to 6 with full motorization, Supports Raman, PL, EL and more
4.
Fully automated cantilever and photodiode alignment
Minimizes setup time and ensures reproducibility
Technical Specifications of LabRAM Soleil Nano
| Specification | Details |
|---|---|
| Sample Scanning Range | 100 µm × 100 µm × 15 µm (±10%) |
| Scanning Non-linearity (XY/Z) | 0.05% XY; 0.05% Z |
| Noise Performance | • < 0.1 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors on
• < 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off • < 0.1 nm RMS in Z dimension in 1000 Hz bandwidth with capacitance sensor on • < 0.03 nm RMS in Z dimension in 1000 Hz bandwidth with capacitance sensor off |
| Resonance Frequency | XY: 7 kHz (unloaded); Z: 15 kHz (unloaded) |
| Movement Control | Digital closed-loop control on X, Y, Z; Motorized Z approach (18 mm) |
| Sample Size | Max 40 × 50 mm, 15 mm thickness |
| Sample Positioning | Motorized range 5 × 5 mm; 1 µm resolution |
AFM Head
| Specification | Details |
|---|---|
| Laser Wavelength | 1300 nm (non-interfering with Raman detector) |
| Noise (Registration System) | < 0.1 nm |
| Alignment | Fully automated cantilever & photodiode alignment |
| Probe Access | Free access for external manipulators and probes |
SPM Measuring Modes
• Semicontact AFM
• True Non-contact AFM
• Top ModeTM
• Phase Imaging
• Dissipation Force Microscopy
• Contact AFM in liquid (optional)
• Semicontact AFM in liquid (optional)
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