
FluoroMax Plus
Steady State and Lifetime Spectrofluorometer
The FluoroMax Plus is a compact benchtop spectrofluorometer offering industry-leading sensitivity and versatility with all-reflective optics and photon counting. It delivers emission spectra out to 1700 nm and TCSPC lifetime measurements as short as 25 ps, supported by powerful FluorEssence™ software and optional accessories for extended lifetime and phosphorimetric analyses.
Why Choose FluoroMax Plus
- All-reflective optics for unmatched sensitivity
- Emission detection to 1700 nm for NIR applications
- Time-correlated single-photon counting to 25 ps for ultrafast kinetics
- Water Raman SNR: 13,000:1 for low-light measurements
- Fast scanning up to 80 nm/second to accelerate throughput
- FluorEssence™ software with method files for workflow recall

Key Advantages of FluoroMax Plus
Ultimate sensitivity
Detects trace fluorophores
Extended spectral range
Supports NIR and deep UV studies
Rapid scanning
Accelerates data acquisition
Ultrafast lifetime measurements
Resolves sub-nanosecond dynamics
Applications of FluoroMax Plus
Environmental Monitoring
Fluorescence detection of trace organic contaminants.
Pharmaceutical R&D
High‑sensitivity lifetime assays for drug discovery.
Material Science
NIR photoluminescence characterization of nanomaterials.
Nanophotonics
Optical properties of nano materials.
Technical Specifications of FluoroMax Plus
Lamp | Vertically mounted, CW, 150 W Ozone-free xenon arc lamp |
Gratings | 1200 groove/mm blazed at 330 nm (excitation) and 500 nm (emission), plane ruled |
Automatic self-calibration of all wavelength drives and slits | |
Monochromators | All reflective optics, Czerny-Turner spectrometers |
Detectors | Emission: R928P photon counting PMT (185-850 nm) and reference photodiode for monitoring lamp output. Optional NIR spectral detectors (out to 2,100 nm) and TCSPC lifetime detectors (down to < 10 ps) are available on the second detection port of the Fluoromax Plus. |
Water Raman S/N | 13,000:1 (FSD method). See Signal-to-noise ratio |
Slits | Continuously variable from 0 to 29 nm |
Accuracy | 0.5 nm |
Repeatability | 0.1 nm |
Minimum step | 0.0525 nm |
Integration time | 0.001 to 160 sec |
Software | FluorEssence |
Spectral Correction Factors | Included |
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