XGT-9000

X-ray Analytical Microscope (Micro-XRF)

The XGT-9000 is a cutting-edge, non-destructive micro-XRF (X-ray fluorescence) analytical microscope offering exceptional speed, flexibility, and elemental mapping capabilities. It delivers ultra-fine spot analysis (down to ≤15 µm), dual-detector imaging (fluorescence and transmission), and multiple probe options—perfect for applications ranging from defect detection in electronics to archaeological artifact analysis.

Why Choose XGT-9000

Superior Sensitivity & Broad Element Range – Detects light elements through heavy metals with enhanced speed and precision.
Dual-Mode Imaging – Simultaneously captures fluorescence and transmission X-ray images for complete surface and internal structure insight.
Multi-Probe Flexibility – Offers fast scanning and high-resolution analysis by switching among a wide range of spot sizes.
User-Friendly Interface – Equipped with high-resolution cameras, versatile lighting, and intuitive software for streamlined operation.

Key Advantages of XGT-9000

1.
Enhanced Detection Sensitivity

Ultra-Fast Analysis

Delivers high sensitivity across wide elemental ranges for rapid, accurate sample screening.

2.
Comprehensive Imaging

Fluorescence + Transmission

Combines internal structure and surface elemental mapping in a single pass.

3.
Adaptive Resolution

Selectable Probes

Switch easily between wide-area scanning and fine detail mapping using diverse spot sizes.

4.
Intuitive Operation

Smart GUI & Lighting

User-friendly interface enhances workflow with clear imaging and customizable layouts.

Technical Specifications of XGT-9000

Basic information
Model	XGT-9000
Model	XGT-9000 Pro	XGT-9000 C	XGT-9000 Expert
Instrument	X-ray analytical microscope
Principle	Energy dispersive X-ray fluorescence spectroscopy
Detectable elements*	F (9) - Am (95)	C (6) - Am (95)	B (5) - Am (95)
Available chamber size	450 mm (W) x 500 mm (D) x 80 mm (H)
Maximum mass of sample	1 kg
Maximum mapping area	100 mm x 100 mm on 300 mm (W) x 250 mm (D)
Sample observation
Optical image observation	Two high resolution cameras
Whole image Detailed image	5 million pixels, Field of view: 100 mm x 100 mm 5 million pixels, Field of view: 2.5 mm x 2.5 mm
Optical design	Vertical-coaxial X-ray and optical observation
Sample illumination / Observation	Top, bottom, side illuminations / Bright and dark fields
X-ray generator
Power	Up to 50 W
Voltage	Up to 50 kV
Current	Up to 1 mA
Target material	Rh
X-ray guide tube (Probe)
Probe spot size selection	Various probe combination can be offered (e.g. 15μm ultra-high intensity probe with X-ray focused spot (Mo Kα))
Detectors
X-ray fluorescence detector	Liquid nitrogen-free Silicon Drift Detector (SDD)
Transmission detector	NaI (Tl)
Operating mode
Measurement environment	Whole vacuum Partial vacuum Whole ambient He purge (optional)	Whole vacuum Partial vacuum Whole ambient He purge (optional)	Whole vacuum Partial vacuum He purge (optional)
Instrument dimension (main unit)
Instrument size	680 mm (W) x 860 mm (D) x 760 mm (H)
Mass weight	Approximately 200 kg

scrollable

*Under whole vacuum condition

Dimensions (unit: mm)

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XGT-9000

Why Choose XGT-9000